JPH044751U - - Google Patents
Info
- Publication number
- JPH044751U JPH044751U JP4394190U JP4394190U JPH044751U JP H044751 U JPH044751 U JP H044751U JP 4394190 U JP4394190 U JP 4394190U JP 4394190 U JP4394190 U JP 4394190U JP H044751 U JPH044751 U JP H044751U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor
- marking
- defective
- measuring
- characteristic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 14
- 239000008188 pellet Substances 0.000 claims description 6
- 230000002950 deficient Effects 0.000 claims description 5
- 238000004519 manufacturing process Methods 0.000 claims description 3
- 230000007547 defect Effects 0.000 claims description 2
- 238000000034 method Methods 0.000 claims 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4394190U JPH044751U (en]) | 1990-04-23 | 1990-04-23 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4394190U JPH044751U (en]) | 1990-04-23 | 1990-04-23 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH044751U true JPH044751U (en]) | 1992-01-16 |
Family
ID=31556791
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4394190U Pending JPH044751U (en]) | 1990-04-23 | 1990-04-23 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH044751U (en]) |
-
1990
- 1990-04-23 JP JP4394190U patent/JPH044751U/ja active Pending
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